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  4. Magnetic and Electrical Characterization of Nickel-Rich Nife Thin Films Synthesized by Atomic Layer Deposition and Subsequent Thermal Reduction
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Magnetic and Electrical Characterization of Nickel-Rich Nife Thin Films Synthesized by Atomic Layer Deposition and Subsequent Thermal Reduction

Journal
Nanotechnology
ISSN
0957-4484
Date Issued
2016
Author(s)
Escrig-Murua, J  
Espejo-Pina, A  
DOI
https://doi.org/10.1088/0957-4484/27/34/345707
Abstract
Nickel-rich NiFe thin films (Ni92Fe8, Ni89Fe11 and Ni83Fe17) were prepared by combining atomic layer deposition (ALD) with a subsequent thermal reduction process. In order to obtain Ni x Fe1-xO y films, one ALD supercycle was performed according to the following sequence: m NiCp2/O3, with m = 1, 2 or 3, followed by one FeCp2/O3 cycle. The supercycle was repeated n times. The thermal reduction process in hydrogen atmosphere was investigated by in situ x-ray diffraction studies as a function of temperature. The metallic nickel iron alloy thin films were investigated and characterized with respect to crystallinity, morphology, resistivity, and magnetism. As proof-of-concept magnetic properties of an array of Ni83Fe17, close to the perfect Permalloy stoichiometry, nanotubes and an isolated tube were investigated. © 2016 IOP Publishing Ltd.
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